Equipment database

Name:
Single crystal X-ray diffractometer
Producer:
Agilent
Model:
SuperNova
Research group:
X-Ray Diffraction Laboratory
Description:

An X-ray diffractometer for measuring monocrystal samples, the measurement is to determine the angle and intensity of the diffracted beams, which [after using the appropriate software] makes it possible to obtain the crystal structure.
A diffractometer equipped with two X-ray sources, both micro-focus with molybdenum [Mova] and copper [Nova] tubes. It is possible to cool and heat the sample from 330K to 90K. Temperature stability [of nitrogen stream] below 1K. CCD Eos detector [64x64mm], kappa goniometer. The standard sample is a monocrystal measuring approximately 0.3x0.3x0.3 mm. Measurement of well dispersed samples takes from one hour to several hours.
The diffractometer is equipped with Crystalis software that controls the experiment and enables the structure to be determined.

Contact:

dr Roman Luboradzki

Research

  • Type of measurement: Study of the crystalline structure of monocrystals
  • Test method: Measurement of angle and intensity of the diffracted beams

Details

  • Name of equipment: Agilent model: SuperNova
  • Type of measurement: Study of the crystalline structure of monocrystals
  • Test method: Measurement of angle and intensity of the diffracted beams
  • Opis:

    The monocrystal, measuring approximately 0.3x0.3x0.3 mm [optimal dimensions, however, it is possible to measure much smaller crystals e.g. "laminas" with a thickness of 0.05mm] is mounted on a special mounting and placed in the diffractometer. In the case of non-stable crystals, losing solvent, etc., it is possible to place the crystal in a capillary or covered with a layer of oil. The measurement is automatic and does not require operator control. It is possible - only if such information is relevant – to restrict the measurement to only the parameters of the elementary cell. It usually takes up to 20 minutes.

  • User performing the measurement: prof. dr hab. Kinga Suwińska
Measurement conditions
Parametr fizyczny Opis parametru
Temperature Possibility of measurement at temperatures from near liquid nitrogen up to 330K. Temperature stability approx. 1K. The temperature can be changed during measurement
Radiation The diffractometer has 2 sources of radiation - Cu and Mo tubes

See also

Contact

IPC PAS for companies

Kasprzaka 44/52

01-224 Warsaw

Tel: 22 343 33 12

E-mail: ichfdlafirm@ichf.edu.pl