Equipment database
- Name:
- UHV surface analysis system
- Producer:
- Prevac, PHI, RHK, OCI Vacuum Microengineering, Inc., SPECS
- Model:
- PHI 5000 Versa Probe (XPS)
- Research group:
- Laboratory of Surface Analysis
- Description:
-
The vacuum system and the sample transmission system produced by PREVAC consists of a central distribution chamber (UFO) for moving the sample between the sections of the apparatus:
- High resolution X-ray photoelectron spectrometer (XPS) equipped with argon ion gun and C60 gun (PHI)
- Preparation chamber with high-pressure reactor, two vacuum evaporators, LEED spectrometer, AES spectrometer and mass spectrometer (OCI Vacuum Microengineering, Inc., SPECS, Prevac)
- Atomic force microscope and scanning tunneling microscope (RHK)
- load chamber,
- sample store.
The vacuum system is used for comprehensive analysis of the chemical composition of the surface of various solid materials with the possibility of characterization the surface topography in nanometric scale and preliminary preparation of the sample surfaces in vacuum conditions.
- Contact:
dr inż. Mirosław Krawczyk
Research
- Type of measurement: Surface chemical composition
- Test method: X-ray Photoelectron Spectroscopy
Details
- Name of equipment: PHI model: Versa Probe 5000
- Type of measurement: Surface chemical composition
- Test method: X-ray Photoelectron Spectroscopy
- User performing the measurement: dr hab. Wojciech Lisowski
- Type of measurement: Imaging the sample surface
- Test method: Scanning tunneling microscopy, atomic force microscopy
Details
- Name of equipment: RHK model: AFM/STM microscope
- Type of measurement: Imaging the sample surface
- Test method: Scanning tunneling microscopy, atomic force microscopy
- User performing the measurement: dr inż. Kostiantyn Nikiforow
- Type of measurement: Surface chemical composition and structure
- Test method: Low Energy Electron Difraction, Auger Electron Spectroscopy
Details
- Name of equipment: OCI Microengineering model: AES/LEED spectrometer
- Type of measurement: Surface chemical composition and structure
- Test method: Low Energy Electron Difraction, Auger Electron Spectroscopy
- User performing the measurement: dr inż. Mirosław Krawczyk