Equipment database

Atomic Force Microscope/Scanning Tunneling Microscope (AFM/STM)
Bruker Nano
MultiMode 8
Research group:
Team 23.Modified electrodes for potential application in sensors and cells

The MultiMode 8 enables work in AFM (Atomic Force Microscopy), STM (Scanning Tunneling Microscopy), MFM (Magnetic Force Microscopy), EFM (Electric Force Microscopy), and more. The microscope is also equipped with electrochemical cells that allow simultaneous surface imaging during electrochemical measurements. The MultiMode microscope is also equipped with an optical imaging system that allows both the precise placement of the probe on the area to be imaged and enables viewing of the sample surface during measurement. In addition, the MultiMode 8 allows for the use of the latest AFM modes such as PeakForce Tapping, ScanAsyst, ScanAsyst-HR, PeakForce QNM and PeakForce TUNA.


prof. dr hab. Marcin Opałło