Equipment database
- Name:
- XPS Spectrometer
- Producer:
- VG Microtech Ltd
- Model:
- CLAM2
- Research group:
- Laboratory of Surface Analysis
- Description:
-
CLAM2 is a hemispherical kinetic electron energy analyzer that provides both X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) analysis. Both techniques are useful in determination of chemical composition of the surface of solid materials with resolution of a few or several nm. The argon ion gun, which is attached to the spectrometer allows make the surface depth profiles and clean the surface of samples from various contaminations.
- Contact:
prof. dr hab. Tadeusz Zakroczymski
Research
- Type of measurement: Surface chemical composition
- Test method: X-ray Photoelectron Spectroscopy
Details
- Name of equipment: VG Microtech Ltd model: CLAM2
- Type of measurement: Surface chemical composition
- Test method: X-ray Photoelectron Spectroscopy
- User performing the measurement: prof dr hab. Tadeusz Zakroczymski
Measurement conditions
| Physical parameter | Parameter description |
| Vacuum | High vacuum |
| Temperature | Room temperature |
- Type of measurement: surface chemical composition (depth profiling)
- Test method: X-ray Photoelectron Spectroscopy + ion etching
Details
- Name of equipment: VG Microtech Ltd model: CLAM2
- Type of measurement: surface chemical composition (depth profiling)
- Test method: X-ray Photoelectron Spectroscopy + ion etching
- User performing the measurement: prof. dr hab. Tadeusz Zakroczymski
Measurement conditions
| Physical parameter | Parameter description |
| Vacuum | High vacuum |
| Temperature | Room temperature |