Equipment database

Name:

UHV surface analysis system

Producer:

Prevac, PHI, RHK, OCI Vacuum Microengineering, Inc., SPECS

Model:

PHI 5000 Versa Probe (XPS)

Research group:

Laboratory of Surface Analysis

Description:

The vacuum system and the sample transmission system produced by PREVAC consists of a central distribution chamber (UFO) for moving the sample between the sections of the apparatus:

• High resolution X-ray photoelectron spectrometer (XPS) equipped with argon ion gun and C60 gun (PHI)
• Preparation chamber with high-pressure reactor, two vacuum evaporators, LEED spectrometer, AES spectrometer and mass spectrometer (OCI Vacuum Microengineering, Inc., SPECS, Prevac)
• Atomic force microscope and scanning tunneling microscope (RHK)
• load chamber,
• sample store.

The vacuum system is used for comprehensive analysis of the chemical composition of the surface of various solid materials with the possibility of characterization the surface topography  in nanometric scale and preliminary preparation of the sample surfaces in vacuum conditions.

Contact:

dr inż. Mirosław Krawczyk