Equipment database
- Name:
- Raman spectrometer
- Producer:
- Renishaw
- Model:
- inVia
- Research group:
- Team 29. Photophysics and spectroscopy of photoactive systems: structure and reactivity of systems with hydrogen bonds
- Description:
-
The Renishaw "inVia" Raman spectrometer, equipped with four excitation light sources: 633nm, 785nm, 514nm and 325nm, coupled with the NT-MDT atomic force microscope (AFM), permits the simultaneous recording of Raman spectra and AFM images of samples. The system allows Raman spectra to be recorded for liquid and solid samples and thin molecular films on solid substrates. - Superior unit : Institute of Physical Chemistry of the Polish Academy of Sciences.
- Contact:
prof. dr hab. Jacek Waluk
Research
- Type of measurement: Recording of Raman spectra
- Test method: Raman spectroscopy
Details
- Name of equipment: Renishaw model: inVia
- Type of measurement: Recording of Raman spectra
- Test method: Raman spectroscopy
- User performing the measurement: dr Agnieszka Kamińska
Measurement conditions
- Parametr fizyczny: Temperature
- Wartość parametru od: 5 K
- Wartość parametru do: 1000 K
- Type of measurement: Analysis of the surface image
- Test method: Atomic force microscopy
Details
- Name of equipment: Renishaw model: inVia
- Type of measurement: Analysis of the surface image
- Test method: Atomic force microscopy
- User performing the measurement: mgr Sylwester Gawinkowski
Measurement conditions
- Parametr fizyczny: Temperature
- Opis parametru: measurements are carried out at room temperature