Equipment database

Name:
Scanning tunneling microscope
Producer:
constructed in Professor K.Wandelt's group, University of Bonn
Model:
EC-STM
Research group:
Team 21. Spectroscopic and microscopic studies STM/AFM of intermolecular interactions
Description:

The microscope enables the local examination of surfaces (topography, electron properties) with nanometric resolution both in a gas environment and at the phase interface: solid-liquid, in aqueous and organic solutions. In addition, it has a potentiostat for working in electrochemical conditions.

Contact:

prof. nadzw. dr hab. Robert Nowakowski

Research

  • Type of measurement: Study of surface topography at nanometer resolution (atomic, molecular)
  • Test method: Surface scanning and measurement of tunnel current (electrons tunneling the potential barrier generated in the interval between the microscope probe and the surface being examined).

Details

  • Name of equipment: constructed in Professor K.Wandelt's group, University of Bonn model: EC-STM
  • Type of measurement: Study of surface topography at nanometer resolution (atomic, molecular)
  • Test method: Surface scanning and measurement of tunnel current (electrons tunneling the potential barrier generated in the interval between the microscope probe and the surface being examined).
  • Opis:

    The basic condition of the measurement is the electrical conductivity of the sample (the substrate + adsorption layer system). The device makes it possible to study smooth surfaces with low roughness (maximum height difference across the entire surface being scanned - several dozen nm). In practice, measurements are made for smooth layers (e.g. metallic), monolayers adsorbed nano-objects on atomic smooth surfaces (e.g. HOPG).

  • Average measurement time: 5 days
  • User performing the measurement: prof. nadzw. dr hab. Robert Nowakowski

See also

Contact

IPC PAS for companies

Kasprzaka 44/52

01-224 Warsaw

Tel: 22 343 33 12

E-mail: ichfdlafirm@ichf.edu.pl